Advantest T2000 Tester Manual - Download Free Apps
Advantest T2. SOC ATE / Mixed Signal Semiconductor Test. Advantest Test Equipment. Functional IC test with the ADVANTEST T2000.
TOKYO, May 09, 2017 (GLOBE NEWSWIRE) - Advantest Corporation’s (TSE:) 11 th annual VOICE Developer Conference will feature dual sessions this month – May 16-17 in the United States and May 26 in China – allowing semiconductor test professionals representing the world's leading integrated device manufacturers (IDMs), foundries, fabless semiconductor companies and outsourced assembly and test (OSAT) providers to come together to share ideas and information. Attendees will hear more than 100 technical presentations, meet with experts at this year’s expanded technology kiosk showcase, visit partners’ expositions, and attend social and networking events.
Both conferences will feature the theme 'Measure the Connected World and Everything in It SM.' The detailed VOICE 2017 technical program is available online. It features Advantest customers, partners and employees from 12 countries and 22 different companies presenting their insights and best practices. This year’s program will have eight technology tracks covering device specific testing, hardware design and integration, improving throughput, reducing time-to-market, new hardware/software test solutions, test methodologies, product engineering, hot topics in the ATE industry, and - for the first time - SmarTEST 8.0 for the V93000 platform. In addition to paper presentations, Advantest R&D engineers and technology experts will be available in kiosks to discuss other testing topics with attendees. A keynote speech will be delivered each morning of the conference.
The Palm Springs event will open with a talk by Advantest's own Hans-Juergen Wagner, senior vice president of the SoC Product Group, who will detail the drivers, challenges and emerging trends of SoC device designs and the impact they have on test. The second day's keynote speaker, Chris Tarbell, will present a dynamic keynote address on hacking and the dark net. Tarbell is one of the most successful cyber security law enforcement officials of all time.
Advantest T2000 Tester
He is responsible for infiltrating the hacker group Anonymous and taking down the notorious dark web drug trafficking site Silk Road, called 'the most sophisticated and extensive criminal marketplace on the Internet.' In Shanghai, Dr. Peter Chen, senior director, China Business Development, TSMC China Company Limited, will share his insights into the global semiconductor industry landscape, technology trends, and especially the ecosystem and market in China. VOICE 2017 in Palm Springs will be held at the Hyatt Regency Indian Wells Resort. The conference kicks off with a Welcome Reception on Monday, May 15 at 6:00 p.m. On Tuesday, May 16, VOICE takes place from 8:30 a.m. To 6:30 p.m., followed by an evening event in the region’s Enchanted Desert.
On Wednesday, May 17, VOICE takes place from 9:00 a.m. To 6:25 p.m., with an awards ceremony and prize drawings shortly thereafter. VOICE 2017 in Shanghai, China will be held at the InterContinental Shanghai Pudong on Wednesday, May 26 from 9:00 a.m. To 5:40 p.m., followed by an evening reception. Attendees should plan to attend the reception for the awards ceremony and prize drawings. Register online.
Online registration closes on Friday, May 11, 2017. On-site registration starts May 16 with a higher registration fee. More event information is available on the VOICE website. During the conference, follow #VOICE2017 on Twitter @AdvantestATE or visit for more ways to connect. To help attendees get the most from VOICE 2017, Advantest has a VOICE Mobile App for both sessions located in the Apple App or Google Play stores.
Search for “Advantest VOICE 2017 USA” and “Advantest VOICE 2017 China” to download. About VOICE 2017 Developer Conference Managed by a steering committee of volunteer representatives from Advantest and its customers, VOICE is the leading conference for the growing international community of users and strategic partners involved with Advantest's V93000 and T2000 SoC test platforms as well as Advantest memory testers, handlers and test cell solutions. The conference offers a unique opportunity to take part in making semiconductor testing operations as efficient and cost-effective as possible. Attendees gain and share valuable insights, build long-lasting relationships and learn what's new about Advantest test equipment, handlers and applications. About Advantest Corporation A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems.
Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as groundbreaking 3D imaging and analysis tools.
Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available. Advantest Corporation 3061 Zanker Road San Jose, CA 95134, USA +1.408.456.3717 Judy Davies judy.davies@advantest.com.
TESIM/U- 51 TESTER SIMULATOR UPDATE NOTICE REV 5.05 1. SUMMARY OF REVISION (6) Corresponding revision Relationship of revision numbers among TESIM/U- 51, ASX/U- 51 (TESTUTL 51SU, ATW 51SU) and system software is shown in the table below.
TESIM/U- 51 REV 5.05 (Note1) ASX/U- 51 (TESTUTL 51SU) (ATW 51SU) REV 6.04 or REV 6.04A (REV 6.04 or REV 6.04A) (REV 6.04 or REV 6.04A) System software Solaris 2.5.1 (Note3) Solaris 7 (Note4) Solaris 8 (Note5) Note1: TESIM/U- 51 REV 5.05 cannot be used in the T5336 and T5311. Install TESIM/U- 51 (tesim 51su) after the following products. testutl 51su atw 51su (when ATLworks is used) Note2: Solaris 2.5.1 Hardware 11/97 and later is required to use Sun Ultra 5. The hybrid controller cannot be used in TESIM/U- 51 REV 5.05. Note3: If Linker Patch (ID: 106950-07) is installed, the hybrid controller is not guaranteed to operate correctly. Note4: Solaris 8 Hardware 7/03 and later is required to use Sun Blade 1500. Solaris 8 2/04 is required to use in the standard 80-GB DISK model of Sun Blade 150.
Solaris 8 2/04 is required to use Sun Blade 1500 1.5 GHz. Note: Notes for when this manual is described. (a) In the above table, the number of the supplemented edition is excluded from the revision number of ASX/U- 51. In revising of the supplemented edition, a new function is not added. Therefore, TESIM/U- 51 can operate on the specific revision number irrespective of the supplemented edition number. Notation of the revision number: XX.YY(C or -)D - General format of the revision number XX: Version number (, 1, 2, 3.) YY: Released edition number (, 01, 02, 03.) C: Updated edition number (, A, B, C.) D: Supplemented edition number (, 1, 2, 3.) (b) There are two applications for TESIM/U- 51. This document explains operations for installing it in a SUN workstation provided by the user.
For ADVANsite (ASX/U- 51) For UserSUN 1-2 Jun 3/05 2. ENHANCED FUNCTION 2.1 T5501 Jun 3/05 TESIM/U- 51 TESTER SIMULATOR UPDATE NOTICE REV 5.05 2.
ENHANCED FUNCTION TESIM/U- 51 REV 5.05 can simulate the T5501. TESIM/U- 51 REV 5.05 can simulate the 768-channel test head. Compatible compiler: XATL/U- 51 (PXTL 51-00S.) REV 6.04 or later The following functions cannot be used in TESIM/U- 51 REV 5.05 with TESTUTL 51SU REV 6.04. These functions can be used in TESIM/U- 51 REV 5.05 with TESTUTL 51SU REV 6.04A.
Two-station configuration of the 768-channel test head Compatible compiler: XATL/U- 51 (PXTL 51-00S.) REV 6.04 or later 64-DUT (32 DUTs per station) parallel test, in which PIN MODE is B, 8 DUTs are assigned per child, and a driver channel is assigned to two DUTs. Compatible compiler: XATL/U- 51 (PXTL 51-00S.) REV 6.04 or later 2.2 ASX/U- 51 REV 6.04 and REV 6.04A TESIM/U- 51 REV 5.05 is compatible with ASX/U- 51 REV 6.04 and REV 6.04A. 2.2.1 The 2.88-Gb AFM Board TESIM/U- 51 REV 5.05 is compatible with the 2.88-Gb AFM board.
For more information, refer to “ATL- 51 Test Plan Program Reference Manual.” TESIM/U- 51 only checks errors. Relevant test systems: TESTUTL 51SU REV 6.04: T5376 and T5375 TESTUTL 51SU REV 6.04A: T5376 and T5375 2.2.2 The 16-Gb AFM Board TESIM/U- 51 REV 5.05 is compatible with the 16-Gb AFM board. For more information, refer to “ATL- 51 Test Plan Program Reference Manual.” TESIM/U- 51 only checks errors. Relevant test systems: TESTUTL 51SU REV 6.04: T5378, T5377, T5377S, and T5372 TESTUTL 51SU REV 6.04A: T5378, T5377, T5377S, and T5372 2.2.3 2-Gb PM Board TESIM/U- 51 REV 5.05 is compatible with the 2-Gb PM board. For more information, refer to “ATL- 51 Test Plan Program Reference Manual.” TESIM/U- 51 only checks errors. Relevant test systems: TESTUTL 51SU REV 6.04: None (.1) TESTUTL 51SU REV 6.04A: T5378, T5377, T5377S, T5376, T5375, and T5372 (.1) This function is added to TESTUTL 51SU REV 6.04A.